ARTICLES - Detecting Over Rejection in Testing of Integrated Circuits
| Year of publication: |
2001
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|---|---|
| Authors: | Chang, T.C. ; Gan, F.F. |
| Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 33.2001, 3, p. 356-364
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