Assessing a Binary Measurement System with Varying Misclassification Rates Using a Latent Class Random Effects Model
| Year of publication: |
2012
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|---|---|
| Authors: | Danila, Oana ; Steiner, Stefan H ; Jock MacKay, R |
| Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 44.2012, 3, p. 179-192
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