Asymptotic equivalence and sufficiency for volatility estimation under microstructure noise
Year of publication: |
2011-05
|
---|---|
Authors: | Reiß, Markus |
Institutions: | Sonderforschungsbereich 649: Ökonomisches Risiko, Wirtschaftswissenschaftliche Fakultät |
Subject: | High-frequency data | integrated volatility | spot volatility estimation | Le Cam deficiency | equivalence of experiments | Gaussian shift |
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