Automatic bubble defect inspection for microwave communication substrates using multi-threshold technique based co-occurrence matrix
| Year of publication: |
2010
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|---|---|
| Authors: | Jiang, Bernard ; Wang, Chien-Chih ; Chen, Hsin-Ju ; Chu, Chien-Cheng |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 48.2010, 8, p. 2361-2372
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