Average outgoing quality limit and lot tolerance percent defective indexed acceptance sampling plans using artificial neural networks
| Year of publication: |
2006
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|---|---|
| Authors: | Vasudevan, D. ; Selladurai, V. |
| Published in: |
International journal of productivity and quality management : IJPQM. - [Olney, Bucks] : Inderscience Enterprises, ISSN 1746-6474, ZDB-ID 21933765. - Vol. 1.2006, 4, p. 411-424
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