Bayes analysis of fault location on distributed systems
| Year of publication: |
1994
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|---|---|
| Authors: | Chang, Y. ; Lander, L. ; Lu, H. ; Wells, M. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 43.1994, 3, p. 457-465
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