Bayes estimation of component-reliability from masked system-life data
| Year of publication: |
1996
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|---|---|
| Authors: | Lin, D. ; Usher, J. ; Guess, F. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 45.1996, 2, p. 233-237
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