Bayes inference for s-shaped software-reliability growth models
| Year of publication: |
1997
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|---|---|
| Authors: | Kuo, L. ; Lee, J. ; Choi, K. ; Yang, T. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 46.1997, 1, p. 76-80
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