Bayesian sequential reliability for Weibull and related distributions
| Year of publication: |
1994
|
|---|---|
| Authors: | Sun, Dongchu ; Berger, James |
| Published in: |
Annals of the Institute of Statistical Mathematics. - Springer. - Vol. 46.1994, 2, p. 221-249
|
| Publisher: |
Springer |
| Subject: | Bayesian sequential test | reliability demonstration test | exponential distribution | Weibull distribution | expected stopping time | producer's risk | consumer's risk |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10005395631