Best performance modeling using complementary DEA-ANN approach : application to Japanese electronics manufacturing firms
He-Boong Kwon (Hasan School of Business, Colorado State University-Pueblo, Pueblo, Colorado, USA) and Jooh Lee and James Jungbae Roh (Department of Management and Entrepreneurship, Rowan University, Glassboro, New Jersey, USA)
| Year of publication: |
2016
|
|---|---|
| Authors: | Kwon, He-Boong ; Lee, Jooh ; Roh, James Jungbae |
| Published in: |
Benchmarking : an international journal ; BIJ. - Bingley : Emerald, ISSN 1463-5771, ZDB-ID 1473104-6. - Vol. 23.2016, 3, p. 704-721
|
| Subject: | Data envelopment analysis | Artificial neural network | Best performance modeling | Japanese electronic industry | Elektronikindustrie | Electronics industry | Japan | Data-Envelopment-Analyse | Neuronale Netze | Neural networks | Performance-Messung | Performance measurement | Unternehmenserfolg | Firm performance |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1108/BIJ-09-2014-0083 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10011526211