Burn-in and Accelerated Testing - On Optimal Burn -- In Procedures -- A Generalized Model
| Year of publication: |
2005
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| Authors: | Cha, J.H. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 2, p. 198-206
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