Capacity-constrained scheduling for a logic IC final test facility
Year of publication: |
2004
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Authors: | Lin, J.T. ; Wang, F.K. ; Lee, W.T. |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 42.2004, 1, p. 79-100
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