//-->
Toggle navigation
Logout
Change account settings
EN
DE
ES
FR
A-Z
Beta
About EconBiz
News
Thesaurus (STW)
Academic Skills
Help
EN
DE
ES
FR
My account
Logout
Change account settings
Login
Publications
Events
Your search terms
Search
Search options
All Fields
Title
Exact title
Subject
Author
Institution
ISBN/ISSN
Published in...
Publisher
Open Access only
Advanced
Search history
My EconBiz
Favorites
Loans
Reservations
Fines
You are here:
Home
Kim, Y., Choi, Y.-K., and Emer...
More details
Kim, Y., Choi, Y.-K., and Emery, S. (2013), "Logistic Regression With Multiple Random Effects: A Simulation Study of Estimation Methods and Statistical Packages," The American Statistician, 67, 171-182
Year of publication:
2014
Authors:
Inan, Gul
;
Ilk-Dag, Ozlem
;
Leon, Alexander de
Published in:
The American Statistician
. - Taylor & Francis Journals, ISSN 0003-1305. - Vol. 68.2014, 2, p. 129-130
Publisher:
Taylor & Francis Journals
Saved in:
More details
Extent:
text/html
Type of publication:
Article
Source:
RePEc - Research Papers in Economics
Persistent link: https://www.econbiz.de/10010823717
EndNote
BibTeX
Zotero, Mendeley, RefWorks, ...
Text
Saved in favorites
Similar items by person
Geographical linked data : a Spanish use case
Leon, Alexander de, (2010)
More ...
A service of the
zbw
×
Loading...
//--> //--> //-->