CLOSE TO YOU? BIAS AND PRECISION IN PATENT-BASED MEASURES OF TECHNOLOGICAL PROXIMITY
| Year of publication: |
2007
|
|---|---|
| Authors: | Benner, Mary ; Waldfogel, Joel |
| Published in: |
Working paper / National Bureau of Economic Research, Inc. - Cambridge, Mass, ISSN 0898-2937, ZDB-ID 12239057. - 2007, 13322
|