Close to you? Bias and precision in patent-based measures of technological proximity
| Year of publication: |
2008
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|---|---|
| Authors: | Benner, Mary ; Waldfogel, Joel |
| Published in: |
Research policy : policy and management studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 1211493. - Vol. 37.2008, 9, p. 1556-1568
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