Combining Band Recovery Data and Pollock's Robust Design to Model Temporary and Permanent Emigration
| Year of publication: |
2001
|
|---|---|
| Authors: | Lindberg, M. S. ; Kendall, W. L. ; Hines, J. E. ; Anderson, Michael G. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 57.2001, 1, p. 273-281
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010947735