Comparison of Group Testing Algorithms for Case Identification in the Presence of Test Error
Year of publication: |
2007
|
---|---|
Authors: | Kim, Hae-Young ; Hudgens, Michael G. ; Dreyfuss, Jonathan M. ; Westreich, Daniel J. ; Pilcher, Christopher D. |
Published in: |
Biometrics. - The International Biometric Society. - Vol. 63.2007, 4, p. 1152-1163
|
Publisher: |
The International Biometric Society |
Saved in:
Saved in favorites
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