Computer Simulation of Fast Electromigration Lifetime Determination Techniques
Year of publication: |
1993
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Authors: | Gilfedder, T.H. ; Jones, B.K. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 9.1993, 6, p. 519-524
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