Correlation between 1-f Noise and Semiconductor Laser Degradation
| Year of publication: |
1994
|
|---|---|
| Authors: | Fukuda, M. ; Hirono, T. ; Kurosaki, T. ; Kano, F. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 10.1994, 4, p. 351-354
|