EconBiz - Find Economic Literature
    • Logout
    • Change account settings
  • A-Z
  • Beta
  • About EconBiz
  • News
  • Thesaurus (STW)
  • Academic Skills
  • Help
  •  My account 
    • Logout
    • Change account settings
  • Login
EconBiz - Find Economic Literature
Publications Events
Search options
Advanced Search history
My EconBiz
Favorites Loans Reservations Fines
    You are here:
  • Home
  • Count Data Models with Virianc...
  • More details
Cover Image

Count Data Models with Viriance of Unknown Form - An Application to a Hedonic Model of Worker Absenteeism.

Year of publication:
1994
Authors: Delgado, M.A. ; Kniesner, T.J.
Institutions: Department of Economics, Indiana University
Subject: labour market | absenteeism
Saved in:
  • More details
Series:
Indiana - Center for Econometric Model Research.
Type of publication: Book / Working Paper
Notes:
21 pages
Source:
RePEc - Research Papers in Economics
Persistent link: https://www.econbiz.de/10005487194
    • EndNote
    • BibTeX
    • Zotero, Mendeley, RefWorks, ...
    • Text
Saved in favorites
    Similar items by subject
    • Obesity and labor market outcomes : the hidden private cost of obesity : lower earnings and lower probability of employment

      Averett, Susan, (2014)

    • Obesity and labor market outcomes : the hidden private cost of obesity : lower earnings and lower probability of employment

      Averett, Susan, (2019)

    • Absenteeism in the European Union.

      Grundemann, R.M.W., (1994)

    • More ...
    Similar items by person
    • Semiparametric Versus Parametric Count-Data Models-- Econometric Considerations and Estimates of Hedonic- Equilibrium Model of Worker Absenteeism.

      Delgado, M.A., (1992)

    • Estimating Labor Supply with Panel Data.

      Smith Conway, K., (1993)

    • The Intertemporal-Substitution Hypothesis is Alive and Well ( But Hiding in the Data)

      Kniesner, T.J., (1993)

    • More ...
    A service of the
    zbw
    • Sitemap
    • Plain language
    • Accessibility
    • Contact us
    • Imprint
    • Privacy

    Loading...