Decentralized diagnosis based on Boolean discrete event models: application on manufacturing systems
| Year of publication: |
2008
|
|---|---|
| Authors: | Sayed-Mouchaweh, M. ; Philippot, A. ; Carre-Menetrier, V. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 46.2008, 19, p. 5469
|