Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
| Year of publication: |
2004
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|---|---|
| Authors: | Lu, C.-J. ; Tsai, D.-M. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 42.2004, 20, p. 4331-4352
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