Degradation - Degradation Analysis of Nano-Contamination in Plasma Display Panels
| Year of publication: |
2008
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|---|---|
| Authors: | Bae, S.J. ; Kim, S.-J. ; Kim, M.S. ; Lee, B.J. ; Kang, C.W. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 57.2008, 2, p. 222-229
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