Detection of machine failure: Hidden Markov Model approach
| Year of publication: |
2009
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|---|---|
| Authors: | Tai, Allen H. ; Ching, Wai-Ki ; Chan, L.Y. |
| Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 57.2009, 2, p. 608-620
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