Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing

Chih-Hsiung Wang

Year of publication:	2009
Authors:	Wang, Chih-hsiung
Published in:	European journal of operational research : EJOR. - Amsterdam : Elsevier, ISSN 0377-2217, ZDB-ID 243003-4. - Vol. 197.2009, 1 (16.8.), p. 126-133
Subject:	Losgröße \| Lot size \| Halbleiterindustrie \| Semiconductor industry \| Theorie \| Theory \| Halbleiter \| Semiconductor \| Produktionssteuerung \| Production control \| Mathematische Optimierung \| Mathematical programming

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