Discussion - The failure-rate of software: Does it exist?
Year of publication: |
1995
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Authors: | Gottfried, P. ; Wortman, M. ; Klutke, G. ; Singpurwalla, N. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 44.1995, 3, p. 466-469
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