DISTRIBUTIONS -- PROBABILITY AND STATISTICAL-INFERENCE - Goodness-of-fit tests for type-I extreme-value and 2-parameter Weibull distributions
| Year of publication: |
1999
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|---|---|
| Authors: | Shimokawa, T. ; Liao, M. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 48.1999, 1, p. 79-86
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