Dynamic Bayesian Evaluation Method for System Reliability Growth Based on In-Time Correction
Year of publication: |
2010
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Authors: | Xing, Y-Y ; Wu, X-Y ; Jiang, P ; Liu, Q |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 59.2010, 2, p. 309-313
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