Elementary Petri net inside RFID distributed database (PNRD)
Year of publication: |
2010
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Authors: | Ngai, E. W. T. ; To, Chester ; Moon, Karen ; Chan, L. K. ; Yeung, Philip ; Lee, Maggie |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 48.2010, 9, p. 2563-2583
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