EM algorithm for one-shot device testing under the exponential distribution
Year of publication: |
2012
|
---|---|
Authors: | Balakrishnan, N. ; Ling, M.H. |
Published in: |
Computational Statistics & Data Analysis. - Elsevier, ISSN 0167-9473. - Vol. 56.2012, 3, p. 502-509
|
Publisher: |
Elsevier |
Subject: | EM algorithm | Bayesian method | One-shot device testing | Exponential distribution | Accelerated factor | Censoring |
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