Estimating component-defect probability from masked system success-failure data
| Year of publication: |
1996
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|---|---|
| Authors: | Reiser, B. ; Flehinger, B. ; Conn, A. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 45.1996, 2, p. 238-243
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