Estimating Number of Events from the Kaplan–Meier Curve for Incorporation in a Literature-Based Meta-Analysis: What You Don't See You Can't Get!
| Year of publication: |
2000
|
|---|---|
| Authors: | Duchateau, Luc ; Collette, Laurence ; Sylvester, Richard ; Pignon, Jean-Pierre |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 56.2000, 3, p. 886-892
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10010947951