Estimating the bias in technical change : a nonparametric approach
Benjamin Hampf, Jens J. Krüger
| Year of publication: |
August 2017
|
|---|---|
| Authors: | Hampf, Benjamin ; Krüger, Jens |
| Published in: |
Economics letters. - Amsterdam [u.a.] : Elsevier, ISSN 0165-1765, ZDB-ID 717210-2. - Vol. 157.2017, p. 88-91
|
| Subject: | Biased technical change | Endogenous directions | Data envelopment analysis | Theorie | Theory | Technischer Fortschritt | Technological change | Data-Envelopment-Analyse | Systematischer Fehler | Bias | Endogenes Wachstumsmodell | Endogenous growth model | Produktionsfunktion | Production function | Technische Effizienz | Technical efficiency |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.econlet.2017.05.023 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10011847320