Estimation and Testing with Overdispersed Proportions Using the Beta-Logistic Regression Model of Heckman and Willis
| Year of publication: |
2000
|
|---|---|
| Authors: | Slaton, Terra L. ; Piegorsch, Walter W. ; Durham, Stephen D. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 56.2000, 1, p. 125-133
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010946419