Estimation of Competing Risks with General Missing Pattern in Failure Types
Year of publication: |
2003
|
Authors: |
Dewanji, Anup
;
Sengupta, Debasis
|
Published in: |
Biometrics. - The International Biometric Society. - Vol. 59.2003, 4, p. 1063-1070
|
Publisher: |
The International Biometric Society
|
Extent: | text/html |
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Type of publication: | Article
|
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Source: | |
Persistent link: https://www.econbiz.de/10010947754