Evaluating and controlling silicon wafer slicing quality using fuzzy analytical hierarchy and sensitivity analysis
Che-Wei Chang; Cheng-Ru Wu; Chin-Tsai Lin; Huang-Chu Chen
| Year of publication: |
2008
|
|---|---|
| Authors: | Chang, Che-Wei ; Wu, Cheng-Ru ; Lin, Chin-Tsai ; Chen, Huang-Chu |
| Published in: |
The international journal of advanced manufacturing technology. - London : Springer, ISSN 0268-3768, ZDB-ID 52651-4. - Vol. 36.2008, 3/4, p. 322-333
|
| Subject: | Fuzzy-Set-Theorie | Fuzzy sets | AHP-Verfahren | AHP approach | Sensitivitätsanalyse | Sensitivity analysis |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10003685800