“Failure limited” data and TTT-based trend tests in multiple repairable systems
| Year of publication: |
2010
|
|---|---|
| Authors: | Satya, Santosh ; Bal, Lalit M. ; Singhal, Poonam ; Naik, S.N. |
| Published in: |
Reliability engineering & system safety. - London : Elsevier, ISSN 0951-8320, ZDB-ID 612029. - Vol. 95.2010, 6, p. 704-707
|