Failure Profile Analysis of Complex Repairable Systems With Multiple Failure Modes
Year of publication: |
2012
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Authors: | Yang, Q ; Hong, Y ; Chen, Y ; Shi, J |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 61.2012, 1, p. 180-192
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