False Discovery Rate-Adjusted Charting Schemes for Multistage Process Monitoring and Fault Identification
| Year of publication: |
2009
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|---|---|
| Authors: | Li, Yanting ; Tsung, Fugee |
| Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 41.2009, 3, p. 186-205
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