Fitting the log-F Accelerated Failure Time Model with Incomplete Covariate Data
| Year of publication: |
1999
|
|---|---|
| Authors: | Cho, Meehyung ; Schenker, Nathaniel |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 55.1999, 3, p. 826-833
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010947465