Formative versus reflective measurement models : two applications of formative measurement
Tim Coltman; Timothy M. Devinney; David F. Midgley; Sunil Venaik
| Year of publication: |
2008
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|---|---|
| Authors: | Coltman, Tim ; Devinney, Timothy M. ; Midgley, David F. ; Venaik, Sunil |
| Published in: |
Journal of business research : JBR. - New York, NY : Elsevier, ISSN 0148-2963, ZDB-ID 189773-1. - Vol. 61.2008, 12, p. 1250-1262
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| Subject: | Messung | Measurement | Betriebliche Kennzahl | Financial ratio | Markteintritt | Market entry | Operations Research | Operations research |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10003784928