Full range testing of the small size effect bias for Benford screening : a note

Yan Bao, Frank Heilig, Chuo-Hsuan Lee & Edward Lusk

Year of publication:	June 2018
Authors:	Bao, Yan ; Heilig, Frank ; Lee, Chuo-Hsuan ; Lusk, Edward
Published in:	International journal of economics and finance. - Toronto, ISSN 1916-971X, ZDB-ID 2531850-0. - Vol. 10.2018, 6, p. 47-52
Subject:	false positive & negative screening errors \| Systematischer Fehler \| Bias \| Theorie \| Theory \| KMU \| SME \| Experiment \| Signalling

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