Fuzzy reliability using a discrete stress-strength interference model
| Year of publication: |
1996
|
|---|---|
| Authors: | Wan, J. ; Liu, T. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 45.1996, 1, p. 145-149
|