Generation of 1-f Spectrum by Relaxation Process in Thin Film Resistors
Year of publication: |
1998
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Authors: | Hashiguchi, S. ; Yamagishi, Y. ; Fukuda, T. ; Ohki, M. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 14.1998, 2, p. 69-72
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