EconBiz - Find Economic Literature
    • Logout
    • Change account settings
  • A-Z
  • Beta
  • About EconBiz
  • News
  • Thesaurus (STW)
  • Academic Skills
  • Help
  •  My account 
    • Logout
    • Change account settings
  • Login
EconBiz - Find Economic Literature
Publications Events
Search options
Advanced Search history
My EconBiz
Favorites Loans Reservations Fines
    You are here:
  • Home
  • Geographic and technological R...
  • More details
Cover Image

Geographic and technological R&D spillovers within the triad: micro evidence from US patents

Year of publication:
2009
Authors: Aldieri, Luigi ; Cincera, Michele
Published in:
The Journal of Technology Transfer. - Springer. - Vol. 34.2009, 2, p. 196-211
Publisher: Springer
Subject: Geographic and technological R&D spillovers | Absorptive capacity | Firms’ productivity growth
Saved in:
  • More details
Extent:
text/html
Type of publication: Article
Source:
RePEc - Research Papers in Economics
Persistent link: https://www.econbiz.de/10005810008
    • EndNote
    • BibTeX
    • Zotero, Mendeley, RefWorks, ...
    • Text
Saved in favorites
    Similar items by subject
    • Geographic and technological R&D spillovers within the triad: micro evidence from US patents

      Cincera, Michele, (2006)

    • Geographic and technological R&D spillovers within the triad: Micro evidence from US patents

      Cincera, Michele, (2009)

    • Geographic and Technological R&D Spillovers within the Triad: Micro Evidence from US Patents

      Aldieri, Luigi, (2009)

    • More ...
    Similar items by person
    • Geographic and technological R&D spillovers within the triad: micro evidence from US patents

      Cincera, Michele, (2006)

    • DOMESTIC VERSUS INTERNATIONAL R&D SPILLOVERS AND PRODUCTIVITY PERFORMANCE OF LARGE INTERNATIONAL FIRMS

      Cincera, Michele, (2004)

    • Micro evidence of the effects of R&D on labour productivity for large international R&D firms

      Cincera, Michele,

    • More ...
    A service of the
    zbw
    • Sitemap
    • Plain language
    • Accessibility
    • Contact us
    • Imprint
    • Privacy

    Loading...