Group Sequential Methods for an Ordinal Logistic Random-Effects Model Under Misspecification
| Year of publication: |
2002
|
|---|---|
| Authors: | Spiessens, Bart ; Lesaffre, Emmanuel ; Verbeke, Geert ; Kim, KyungMann |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 58.2002, 3, p. 569-575
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010946394