How to measure and draw causal inferences with patent scope

Jeffrey M. Kuhn and Neil C. Thompson

Year of publication:	2019
Authors:	Kuhn, Jeffrey M. ; Thompson, Neil C.
Subject:	causal inference \| examiner toughness \| innovation \| measurement \| patent examiners \| Patent scope \| Patent \| Innovation \| Kausalanalyse \| Causality analysis \| Messung \| Measurement \| Theorie \| Theory \| Patentrecht \| Patent law \| Induktive Statistik \| Statistical inference

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