Identifying technology lock-in and tracing knowledge source trajectories : a case study of lithography
Pei Chen, Kashosi Gad David and Diyi Zhao
| Year of publication: |
2024
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|---|---|
| Authors: | Chen, Pei ; David, Kashosi Gad ; Zhao, Diyi |
| Published in: |
Technology analysis & strategic management. - London : Taylor & Francis Group, ISSN 1465-3990, ZDB-ID 1485021-7. - Vol. 36.2024, 10, p. 2414-2429
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| Subject: | knowledge sources | lithography | Technology lock-in | technology main path | technology trajectories | Technischer Fortschritt | Technological change | Wissensmanagement | Knowledge management | Wissenstransfer | Knowledge transfer | Patent | Wissen | Knowledge | Innovationsmanagement | Innovation management | Technologie | Technology |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1080/09537325.2022.2145942 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10015108211