Intermittent failure process and false alarm interaction modelling of threshold-based monitoring built-in tests (BITs)
Yiqian Cui, Junyou Shi and Zili Wang
| Year of publication: |
1-15 March 2016
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|---|---|
| Authors: | Cui, Yiqian ; Shi, Junyou ; Wang, Zili |
| Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 54.2016, 5/6 (1/15.3.), p. 1610-1626
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| Subject: | intermittent failure | false alarm | failure-test profile | numerical analysis | built-in test (BIT) |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1080/00207543.2015.1023403 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10011495508