Joint Modeling of Progression of HIV Resistance Mutations Measured with Uncertainty and Failure Time Data
Year of publication: |
2007
|
---|---|
Authors: | Hu, Chengcheng ; Gruttola, Victor De |
Published in: |
Biometrics. - The International Biometric Society. - Vol. 63.2007, 1, p. 60-68
|
Publisher: |
The International Biometric Society |
Saved in:
Online Resource
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